The Russell Berrie Nanotechnology Institute at the Technion – Israel Institute of Technology together with RWTH Aachen University and the Jülich Research Center, will hold an Umbrella Winter School on Advanced Characterization Methods.
The school will focus on all aspects of electron microscopy, super resolution imaging, X-ray techniques and surface analysis.
Six JARA scientists will be on the podium as speakers.
Further information on the Webpage of Russell Berrie Nanotechnology Institute at Technion.
